Our Mission
Predictive manufacturing systems with the highest security standards.
Data
From raw files to model inference by employing self-hosted data pipeline
Model
Machine learning models designed to optimize the cost and reability objective function
Deployment
Data under control with model inference behind your firewall
DeepFab
The DeepFab technology comprises several predictive manufacturing systems working together:
- inProbe: Smart Product Routing
- inSure: Smart Reliability Control
- inLab: Advanced Analytics
- inMap: Wafer Bin Map Pattern Recognition
Delivering:
- Reduced wafer cost and required electrical test capacity
- Reliability improvement and process feedback
- The root cause of yield excursions
- Pattern recognition based monitoring and reporting
Pricing
Would you like to learn more about:
- what can your fab gain from predictive systems?
- running a pilot study?
- a complete DeepFab solution?
The price of the solution depends on the type and scope of services and support provided. Let's schedule a meeting:
Contact UsNews
Invitation to Our CEO's Oral Session at ESREF 2023
We are honored to announce our participation in ESREF 2023, held in Toulouse, France from Oct 2-5. Our CEO will be hosting an oral session to present the research team's latest paper…
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Visit Us at SEMICON Taiwan 2023!
We are excited to announce that Inference Technologies is going to be a proud participant in the upcoming SEMICON Taiwan event taking place on Sep 6-8…
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Yield Prediction and Smart Product Routing Using Deep Learning
The presented solution proved its effectiveness and reliability of prediction and classification after implementation in a semiconductor company…
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Deep Learning Techniques for Integrated Circuit Die Performance Prediction
Predicting integrated circuit functionality based on process control monitoring parameters without individual die testing is a major challenge for manufacturers…
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Integrated Circuit Die Level Yield Prediction Using Deep Learning
Given the integrated circuits production scale, the amount of process control monitoring data enable to develop an efficient algorithm for IC yield prediction at the die-level…
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Let's schedule a DeepFab presentation or a PoC consultation: